Redux AFM
3D images at the nanoscale in 3 clicks
Description
A higher level of automation
- Easy set-up: laserless AFM system (no laser alignment)
- Automatic approach: one-click automatic approach in seconds
- Simple sample positioning: motorized XY stage and integrated optical microscope
- Collect topography, phase images, film thickness, roughness, particle size and more
Fastest time to data for small sample AFM
- From sample loading to data in two minutes (256 x 256 pixel scan)
- Automatic frequency sweep, automatic approach and fast scanning
- Up to 1024 x 1024 scans at <0.15 nm noise floor (available on Redux Pro)
Ultra-durable probes with 1000+ scan lifetime
- Ultra-low tapping force: no sample damage and compatible with soft samples such as elastomers
- Ultra-durable materials: diamond-like carbon (DLC)
- No more tedious silicon tip changes: simple tip cartridge changes every 1,000 scans
- The only AFM with an easy-to-use tip cartridge
- Tip cartridge system features TipGuard technology that prevents tip crashes
AFM Specifications |
|
| Max scan area (XY) | 20 μm x 20 μm |
| Z Range | 10 μm |
| Scan speed | 80 seconds (256 x 256 pixel, 20 μm x 20 μm) |
| Noise floor | <0.15 nm (available on Redux Pro) |
| XY Scanner resolution | <0.5 nm |
| Sample | |
| Max sample size | 70 mm x 50 mm x 18 mm |
| Accessible area (motorized) | 10 mm x 10 mm |
| Integrated Optical Microscope | |
| Objective | 10x, 0.25 NA |
| FOV | 2.25 mm × 1.25 mm |
| Resolution | 1920 x 1080 FHD Video output |
| System Dimensions | |
| Dimensions (L x W x H) | 25 cm × 20 cm × 15 cm |
| Weight | 4 kg |
| Software and I/O | |
| Communication | USB |
| Operating System | Windows 10, 11 |
| Power | |
| Power supply | Class II (two prong) |
| Input | 100-240 VAC ~ 50/60 Hz |
| Output | 12 VDC, 5 A |
